Test Probe Series-

Test Finger

Integrated precision contact fingers for mainstream packages (DIP/SOP/SOT/TO). Modular design delivers low-cost, reliable connections for low-to-medium speed testing.

Features:

Broad Package Compatibility: Supports DIP, SOP, SOT, TO, TSSOP, SSOP and various pin pitches, with a full product lineup.
Easy & Accurate Setup: Integrated multi-contact design eliminates single-probe calibration, boosting installation efficiency.
Cost-Effective: Modular pricing cuts costs significantly vs. multi-probe solutions for low-to-medium performance testing.
Durable & Reliable: Wear-resistant coating for long life in mid-volume production environments.

Test Probes

High-precision spring-loaded test probes in single/dual-ended, coaxial, and Kelvin types. Compatible with all package chips, for high/low frequency, production, and manual testing.

Features:

Ultra-precise Specifications: Min. outer diameter 0.11mm, min. length 1.00mm, ideal for ultra-fine pitch and high-density testing.
Full Application Coverage: Supports single/dual-ended, tubeless, coaxial, and Kelvin probes. Customizable tips and coatings for diverse test needs.
Stable & Reliable: Low contact resistance with excellent signal integrity, suitable for high-frequency, high-current, and tri-temperature testing.
Easy Maintenance: Individual design allows single-probe replacement, lowering long-term costs.